bcm63xx/u-boot/test/py, branch master

test/py: don't use mmc_rd config for other mmc tests

2019-05-09T23:52:55Z

Fix test_mmc_dev(), test_mmc_rescan(), test_mmc_info() not to use the same configuration data that test_mmc_rd() does. Doing so causes the following issues: * The new code uncondtionally expects certain keys to exist in the configuration data. These keys do not exist in existing configuration data since they were not previously required, and there was no notification re: a requirement to add these new keys. This causes test failures due to thrown exceptions when accessing the non-existent keys. * The new tests logically operate on different objects. test_mmc_rd() operates on ranges of sectors on an MMC device (which may be the entire set of sectors of a device, or a part of a device), whereas all the new tests operate solely on entire devices. These are separate things, and it's entirely likely that the user will wish to runs the two types of tests on different sets of data; see the example configuration data that this commit adds. Ideally, the new tests would have been added to a separate Python file, since they aren' closely related to the existing tests. FIXME: Marek, can you please replace the "???" in this patch with some reasonable looking data? Thanks. Cc: Marek Vasut Fixes: 4ffec8cdf512 ("test/py: mmc: Add 'mmc info' test") Fixes: ce4b2cafa79c ("test/py: mmc: Add 'mmc rescan' test") Fixes: 86dfd152c917 ("test/py: mmc: Add 'mmc dev' test") Signed-off-by: Stephen Warren

avb: add support for named persistent values

2019-04-26T22:58:22Z

AVB 2.0 spec. revision 1.1 introduces support for named persistent values that must be tamper evident and allows AVB to store arbitrary key-value pairs [1]. Introduce implementation of two additional AVB operations read_persistent_value()/write_persistent_value() for retrieving/storing named persistent values. Correspondent pull request in the OP-TEE OS project repo [2]. [1]: https://android.googlesource.com/platform/external/avb/+/android-9.0.0_r22 [2]: https://github.com/OP-TEE/optee_os/pull/2699 Reviewed-by: Simon Glass Reviewed-by: Sam Protsenko Signed-off-by: Igor Opaniuk

efi_selftest: do not run FDT test with ACPI table.

2019-04-22T22:37:28Z

The EBBR specification prescribes that we should have either an ACPI table or a device tree but not both. So do not run the device tree unit test on boards with an ACPI table. Hence there is no need any longer to make it 'on request' only. Do not pass $fdtcontroladdr to `bootefi selftest`. Signed-off-by: Heinrich Schuchardt

test/py: pytest.mark.notbuildconfigspec()

2019-04-22T22:37:28Z

We already can let a Python test depend on a build option being set via @pytest.mark.buildconfigspec(). It may be necessary to let a test depend on a build option *not* being set. So let's introduce @pytest.mark.notbuildconfigspec for this purpose. Signed-off-by: Heinrich Schuchardt

test: py: Extend fpga test with fit image with external data

2019-04-16T09:51:34Z

Images are created mkimage -f fit.its -E download-fit-external.ub and test expects these entries. env__fpga_under_test = { ... "mkimage_fit_external": download-fit-external.ub", "mkimage_fit_external_size": xxxxx, ... } Test download file and loads it to fpga. Signed-off-by: Michal Simek Reviewed-by: Simon Glass

test.py: Disable fsck for FAT tests for now

2019-04-10T12:15:56Z

Currently enabling fsck on FAT16/FAT32 exposes that we have problems with: TestFsBasic.test_fs13[fat16] TestFsBasic.test_fs11[fat32] TestFsBasic.test_fs12[fat32] TestFsBasic.test_fs13[fat32] TestFsExt.test_fs_ext1[fat32] TestFsExt.test_fs_ext2[fat32] TestFsExt.test_fs_ext3[fat32] TestFsExt.test_fs_ext4[fat32] TestFsExt.test_fs_ext5[fat32] TestFsExt.test_fs_ext6[fat32] TestFsExt.test_fs_ext7[fat32] TestFsExt.test_fs_ext8[fat32] TestFsExt.test_fs_ext9[fat32] TestMkdir.test_mkdir6[fat16] TestMkdir.test_mkdir1[fat32] TestMkdir.test_mkdir2[fat32] TestMkdir.test_mkdir3[fat32] TestMkdir.test_mkdir4[fat32] TestMkdir.test_mkdir5[fat32] TestMkdir.test_mkdir6[fat32] TestUnlink.test_unlink1[fat16] TestUnlink.test_unlink2[fat16] TestUnlink.test_unlink3[fat16] TestUnlink.test_unlink4[fat16] TestUnlink.test_unlink5[fat16] TestUnlink.test_unlink6[fat16] TestUnlink.test_unlink7[fat16] TestUnlink.test_unlink1[fat32] TestUnlink.test_unlink2[fat32] TestUnlink.test_unlink3[fat32] TestUnlink.test_unlink4[fat32] TestUnlink.test_unlink5[fat32] TestUnlink.test_unlink6[fat32] TestUnlink.test_unlink7[fat32] This is because we don't update the "information sector" on FAT32. While in the future we should resolve this problem and include that feature, we should enable fsck for ext4 to ensure that things remain in good shape there. Signed-off-by: Tom Rini

test/py: mmc: Add 'mmc read' performance check

2019-04-10T00:04:05Z

Add option to the mmc rd test to check the duration of the execution of the mmc read command. This allows intercepting read performance regressions. Signed-off-by: Marek Vasut Cc: Tom Rini Cc: Simon Glass Reviewed-by: Simon Glass

test/py: mmc: Add 'mmc info' test

2019-04-10T00:04:05Z

Add test for 'mmc info' subcommand. This tests whether the card information is obtained correctly and verifies the device, bus speed, bus mode and bus width. Signed-off-by: Marek Vasut Cc: Tom Rini Cc: Simon Glass Reviewed-by: Simon Glass

test/py: mmc: Add 'mmc rescan' test

2019-04-10T00:04:05Z

Add test for 'mmc rescan' subcommand. This tests whether the system can switch to a specific card and then rescan the card. Signed-off-by: Marek Vasut Cc: Tom Rini Cc: Simon Glass Reviewed-by: Simon Glass

test/py: mmc: Add 'mmc dev' test

2019-04-10T00:04:04Z

Add separate test for 'mmc dev' subcommand. This tests whether the system can switch to a specific card. Signed-off-by: Marek Vasut Cc: Tom Rini Cc: Simon Glass Reviewed-by: Simon Glass